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Phys. Rev. D 54, 2994–3005 (1996)

Measurement of the inclusive semielectronic D0 branching fraction

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Y. Kubota et al.
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Received 25 October 1995; published in the issue dated 1 September 1996

Using the angular correlation between the π+ emitted in a D*+D0π+ decay and the e+ emitted in the subsequent D0Xe+ν decay, we have measured the branching fraction for the inclusive semielectronic decay of the D0 meson to be B(D0Xe+ν)=[6.64±0.18(stat)±0.29(syst)]%. The measurement uses 1.7 fb-1 of e+e- collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results we find B(D0Xe+ν)/B(D0K-π+)=1.684±0.056(stat)±0.093(syst) and B(D0K-e+ν)/B(D0Xe+ν)=0.581±0.023(stat)±0.028(syst). The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is also presented.

© 1996 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevD.54.2994
DOI:
10.1103/PhysRevD.54.2994
PACS:
13.20.Fc, 14.40.Lb